Sarcouncil Journal of Engineering and Computer Sciences
Sarcouncil Journal of Engineering and Computer Sciences
An Open access peer reviewed international Journal
Publication Frequency- Monthly
Publisher Name-SARC Publisher
ISSN Online- 2945-3585
Country of origin-PHILIPPINES
Impact Factor- 3.7
Language- English
Keywords
- Engineering and Technologies like- Civil Engineering, Construction Engineering, Structural Engineering, Electrical Engineering, Mechanical Engineering, Computer Engineering, Software Engineering, Electromechanical Engineering, Telecommunication Engineering, Communication Engineering, Chemical Engineering
Editors

Dr Hazim Abdul-Rahman
Associate Editor
Sarcouncil Journal of Applied Sciences

Entessar Al Jbawi
Associate Editor
Sarcouncil Journal of Multidisciplinary

Rishabh Rajesh Shanbhag
Associate Editor
Sarcouncil Journal of Engineering and Computer Sciences

Dr Md. Rezowan ur Rahman
Associate Editor
Sarcouncil Journal of Biomedical Sciences

Dr Ifeoma Christy
Associate Editor
Sarcouncil Journal of Entrepreneurship And Business Management
Advancing Domestic Semiconductor Manufacturing: A Critical Review of Novel Processing Technologies
Keywords: Semiconductor Manufacturing, Wide-Bandgap Semiconductors, 2D Materials, Extreme Ultraviolet Lithography (EUVL), Defect, Detection.
Abstract: The semiconductor industry is vital to modern technology and national security but faces challenges like geopolitical tensions, supply chain disruptions, and manufacturing complexity. This paper reviews the state of domestic semiconductor manufacturing, emphasizing the need for innovation and strategic investments to ensure resilience. We explore the evolution of semiconductor technologies, from early planar processes to advanced nanofabrication and lithography, and discuss the national importance of semiconductors in critical infrastructure and security. The paper also examines novel processing technologies, such as Gate-All-Around (GAA) MOSFETs and extreme ultraviolet lithography (EUVL), and emerging materials like wide-bandgap semiconductors and 2D materials, which promise to overcome silicon's limitations. Advanced quality control methods, including AI-driven defect detection, are highlighted as essential for improving manufacturing reliability. By addressing these areas, this paper provides a roadmap for advancing domestic semiconductor manufacturing and maintaining global leadership.
Author
- Jochebed Akoto Opoku
- Department of Telecommunication Engineering Kwame Nkrumah University of Science and Technology Ghana
- Yaw Sefa-Boateng
- Department of Engineering Norfolk State University U.S.A