Sarcouncil Journal of Engineering and Computer Sciences

Abstract: Static Timing Analysis (STA) stands as a fundamental cornerstone of semiconductor design validation, evolving dramatically to meet the unprecedented challenges presented by advanced technology nodes. As transistor dimensions approach atomic scales at 5nm and below, physical phenomena once considered negligible now dominate circuit performance characteristics, with interconnect delays and process variations emerging as critical bottlenecks. This technical review explores the transformation of STA methodologies across several dimensions: from deterministic to statistical approaches, from isolated to integrated analyses, and from human-driven to machine learning-enhanced techniques. The document examines key challenges including process variability management, interconnect parasitic effects, and power-timing interdependence, while highlighting advanced methodologies such as Statistical STA, Multicorner Multiscenario Analysis, and timing-driven physical design integration. Technology-specific considerations for FinFET and Gate-All-Around architectures are addressed, alongside on-chip variation management strategies and clock domain considerations. Looking forward, the review explores promising developments in machine learning integration, cloud-based infrastructure evolution, and system-level timing expansion, providing a comprehensive perspective on how STA continues to adapt and remain essential for semiconductor design validation in the nanometer era.